Generation means analysis of traits related to lodging using two crosses of durum × emmer wheat

Lodging is one of the most important factors that affect wheat final yield. Emmer [Triticum turgidum subsp. dicoccum (Schrank ex Schübl.) Thell.] a likely gene source to improve durum [T. L. (Desf.) Husn.]; however, it highly susceptible lodging. The genetic studies traits related lodging in crosses × emmer remains largely understudied. Here, we used progenies (six generations) derived from two generation means analysis (GMA) determine action, inheritance, and gain selection respect plant height its traits. results indicated resistance was significantly negatively correlated with positively grain yield mainly influenced by stem diameter. GMA epistasis did not play an essential role control almost major portion variation these resulted additive actions. Also for all studied traits, variance higher than dominance one. Narrow sense heritability 0.60 after cycle positive components both crosses. It found that, early generations may result simultaneous reduction increased diameter crossings.